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Vironova awarded US patent for further automation of TEM

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Vironova has been granted a US patent with the title “A method for automatic correction of astigmatism”.

Their method removes a manual step that requires considerable operator skill. It can be applied to any electron microscope, allowing for automated correction of the electron beam and ultimately enabling fully automated image acquisition. An important feature of the present invention is that the method uses only image data to automatically correct for lens astigmatism during the alignment process, without relying on physical features and characteristics of the microscope itself. This means that the method can not only be used to perform the fine tuning but it can also be applied to any electron microscope, with no information required on internal physical features.

“This patent is a manifestation of our strategy to strengthen our core technology through a multi-disciplinary innovation process. Our constant goal is to increase user friendliness and improve the accessibility of the unique information inherent in electron microscopy,”  Mohammed Homman, CEO, Vironova.

“With this method we take an important step towards automatic, high quality image acquisition and ultimately fully automated and objective nano-particle characterization in life science and material science applications,”  says Ida-Maria Sintorn, Chief Technology Officer Vironova.

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